Part Number: TMS570LC4357 Tool/software: Code Composer Studio Hello, I am working with a custom board using the TMS570LC4357 . I've been using this custom board with no issues with one Halcogen project. I revised this project (simply disabling drivers that were not needed for our application code) and tried to program the board using the XDS110 USB debug probe and received the following error: CortexR5: Error connecting to the target: (Error -1170 @ 0x0) Unable to access the DAP. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK). (Emulation package 8.0.903.2) Dap: Error: (Error -242 @ 0x0) A router subpath could not be accessed. The board configuration file is probably incorrect. (Emulation package 8.0.903.2) I looked further into the connectivity issues, and received the following results when executing the 'Test Connection' utility in the Target Config: [Start: Texas Instruments XDS110 USB Debug Probe] Execute the command: %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity [Result] -----[Print the board config pathname(s)]------------------------------------ C:\Users\j65396\AppData\Local\TEXASI~1\CCS\ ti\1\1\BrdDat\testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 100- or 510-class product. This utility will load the adapter 'jioxds110.dll'. The library build date was 'Nov 21 2018'. The library build time was '00:08:45'. The library package version is '8.0.903.2'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '5' (0x00000005). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the XDS110 with USB interface. The link from controller to target is direct (without cable). The software is configured for XDS110 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Test 3 Word 20: scanned out 0xFE03E0E2 and scanned in 0x00000002. Test 3 Word 21: scanned out 0xFE03E0E2 and scanned in 0x00000000. Test 3 Word 22: scanned out 0xFE03E0E2 and scanned in 0x00000000. Test 3 Word 23: scanned out 0xFE03E0E2 and scanned in 0x00000000. Test 3 Word 24: scanned out 0xFE03E0E2 and scanned in 0x00000000. Test 3 Word 25: scanned out 0xFE03E0E2 and scanned in 0x00000000. Test 3 Word 26: scanned out 0xFE03E0E2 and scanned in 0x00000000. Test 3 Word 27: scanned out 0xFE03E0E2 and scanned in 0x00000000. The details of the first 8 errors have been provided. The utility will now report only the count of failed tests. Scan tests: 3, skipped: 0, failed: 1 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 2 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 3 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 4 Some of the values were corrupted - 60.4 percent. The JTAG IR Integrity scan-test has failed. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x7F01F071. Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0x7F01F071. Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0x7F01F071. Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0x7F01F071. Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0x7F01F071. Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0x7F01F071. Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0x7F01F071. Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0x7F01F071. The details of the first 8 errors have been provided. The utility will now report only the count of failed tests. Scan tests: 3, skipped: 0, failed: 1 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 2 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 3 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 4 Some of the values were corrupted - 65.6 percent. The JTAG DR Integrity scan-test has failed. [End: Texas Instruments XDS110 USB Debug Probe] These results raised the following questions: 1. What exactly are the JTAG IR/DR integrity scan-tests doing? 2. What are some factors that could cause these tests to fail? After unsuccessfully attempting to program my custom board with my new Halcogen project, I thought that I'd further investigate and test out the new Halcogen settings on my Hercules HDK TMS570LC4357 board. I successfully programmed my HDK board with the new Halcogen project with an XDS100v2 USB debug probe, which raised the following questions: 3. Is the updated halcogen project not causing these connectivity issues? 4. Is there something wrong with my XDS110 debugger probe? I would greatly appreciate any resources that could help me answer my 4 questions above. Thanks, Vicki
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